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Lambda 265 with Software

ITEM#: 2886-N4100010

MFR#: N4100010

Lambda 265 Compact Photo Diode array (PDA) UV/Vis spectrophotometer detector with 512 pixels with a spectral resolution of 2 nm. Enables data to be acquired simultaneously across the full wavelength range- from 190 nm to 1100 nm. The LAMBDA 265 is th

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Lambda 265 Compact Photo Diode array (PDA) UV/Vis spectrophotometer detector with 512 pixels with a spectral resolution of 2 nm. Enables data to be acquired simultaneously across the full wavelength range- from 190 nm to 1100 nm. The LAMBDA 265 is th
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Product Name Description Item# QTY
Manufacturer Default Logo Lambda 265/465 Color Analysis Software GSA_Logo Lambda 265/465 UV/Vis Spectrophotometers Color Analysis Software Measures color value and color difference. Displays Yxy chromaticity diagram 2886-N4108006 EA
Manufacturer Default Logo Lambda 465 with Software GSA_Logo The LAMBDA 465 is the innovative PDA solution that provides maximum reliability -- for maximum confidence in your results.Its PDA technology allows the acquisition of a full spectrum -- from 1100nm to 190nm -- in as little as 20 msec. In addition, th 2886-N4100030 EA
Lambda Architectural Glass Software {2886-L6100116} Lambda Architectural Glass Software GSA_Logo Lambda UV/Vis/NIR Architectural Glass Software, reflectance & transmittance properties of thin-film coatings applied to architectural glass. Includes ISO, DIN and ASTM methods for light, solar and UV, UVA and UVB and normal, double and triple glazin 2886-L6100116 EA
Xenon Lamp for LAMBDA 265 {2886-N4103008} Xenon Lamp for LAMBDA 265 GSA_Logo Xenon Lamp for LAMBDA 265.Caution: Eye protection is required when viewing deuterium, tungsten and xenon lamps when lit. Our long-lifetime xenon lamps provide the best wavelength coverage across the working range of the spectrometer for consistently 2886-N4103008 EA
LAMBDA 265 REFLECTANCE MODULE ACCESSORY {2886-N4103003} LAMBDA 265 REFLECTANCE MODULE ACCESSORY GSA_Logo Lambda 265 UV/Vis Spectrophotometer Reflectance Module Accessory. Designed for measuring specular reflectance spectra at a fixed angle (incident angle: 30° fixed). It is used for film thickness measurement. 2886-N4103003 EA
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