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EI Source Rebuild Kit

PERKINELMER

ITEM#: 2886-N6480461

MFR#: N6480461

EI Source Rebuild Kit is used to rebuild the Electron Impact (EI) source, typically needed to maintain high-sensitivity volatile analysis, ensuring peak performance and reducing downtime for the GC/MS.

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EI Source Rebuild Kit is used to rebuild the Electron Impact (EI) source, typically needed to maintain high-sensitivity volatile analysis, ensuring peak performance and reducing downtime for the GC/MS.

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Product Name	Description	Item#	QTY
EI Trap Rebuild Kit	EI trap rebuild kit designed for maintenance and restoration of ion trap systems.	2886-N6480460	EA
TurboMass Inner Source Rebuild Kit	used to service and maintain the ion source components of the TurboMass GC-MS series.	2886-E6400043	EA
Source Lens #3 (EI & CI)	Third source lens component for EI and CI processes in mass spectrometry instruments.	2886-N6480149	EA
Source Lens #1 (EI & CI)	Source lens number one designed for EI and CI ionization processes in mass spectrometry.	2886-N6480147	EA
Source Lens #2 (EI 7 CI)	Source lens number two for electron impact and chemical ionization applications in laboratories.	2886-N6480148	EA