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ITEM#: 2886-N6480149
MFR#: N6480149
Third source lens component for EI and CI processes in mass spectrometry instruments.
| Product Name | Description | Item# | QTY | |
|---|---|---|---|---|
Source Lens #1 (EI & CI)
|
Source lens number one designed for EI and CI ionization processes in mass spectrometry. | 2886-N6480147 | EA | |
Source Lens #2 (EI 7 CI)
|
Source lens number two for electron impact and chemical ionization applications in laboratories. | 2886-N6480148 | EA | |
EI & CI Trap
|
Electron impact and chemical ionization trap used in mass spectrometry systems. | 2886-N6480142 | EA | |
EI Source Rebuild Kit
|
EI Source Rebuild Kit is used to rebuild the Electron Impact (EI) source, typically needed to maintain high-sensitivity volatile analysis, ensuring peak performance and reducing downtime for the GC/MS. | 2886-N6480461 | EA | |
EI & CI Trap Ceramic Insulator
|
Ceramic insulator designed to protect EI and CI traps in analytical instruments. | 2886-N6480143 | EA |