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ITEM#: 2886-N6480148
MFR#: N6480148
Source lens number two for electron impact and chemical ionization applications in laboratories.
| Product Name | Description | Item# | QTY | |
|---|---|---|---|---|
Source Lens #1 (EI & CI)
|
Source lens number one designed for EI and CI ionization processes in mass spectrometry. | 2886-N6480147 | EA | |
Source Lens #3 (EI & CI)
|
Third source lens component for EI and CI processes in mass spectrometry instruments. | 2886-N6480149 | EA | |
SOURCE REPLACEMENT KIT FOR THE SPECT 2
|
PERKIN ELMER SOURCE REPLACEMENT KIT FOR THE SPECTRUM TWO. PERKIN ELMER | 2886-L1600243 | EA | |
EI Source Rebuild Kit
|
EI Source Rebuild Kit is used to rebuild the Electron Impact (EI) source, typically needed to maintain high-sensitivity volatile analysis, ensuring peak performance and reducing downtime for the GC/MS. | 2886-N6480461 | EA | |
Outer Ion Source and Optics
|
used to efficiently generate, guide, and focus ions toward the mass analyzer while removing neutrals and contaminants. | 2886-E6400206 | EA |